2017 Spring Meeting

  • 02 Mar 2017
  • 5:00 PM - 9:00 PM
  • GE Healthcare, 100 Results Way, Marlborough, MA 01752

Registration

  • Registration for Spring Meeting Speakers Only

Registration is closed

Join NESM for our annual Spring Meeting on Thursday, March 2nd at GE Healthcare in Marlborough, MA (100 Results Way, Marlborough, MA 01752)!  The meeting will consist of facility tours, two technical talks and a buffet dinner. We look forward to seeing you there!




Meeting Schedule

5:00 PM - Registration & Facility Tours
6:00 PM - Dinner
6:50 PM - Welcome


7:00 PM - "Enabling Live-cell Super Resolution Microscopy: History & Design of the OMX-SR System"Steve Reese, Principal Systems Engineer, GE Life Sciences and Cellular Research Division

7:35 PM - "Combining Ionic Liquids with Scanning Electron Microscopy for In Situ Imaging of Nanoscale Dynamics in Solvated Systems" David Hoagland, PhD, UMass, Amherst, Department of Polymer Science and Engineering


8:10 PM - Closing


Speaker Abstracts and Bios



"Enabling Live-cell Super Resolution Microscopy: History & Design of the OMX-SR System"Steve Reese, Principal Systems Engineer, GE Life Sciences and Cellular Research Division




Video - GE_SteveReese.mov


Abstract:  After the successful commercialization of the OMX microscope licensed from UCSF in 2007, the focus moved to the design of a Structured Illumination Microscope that could operate quickly enough to stop the motion in living cells.  The target benchmark was to accomplish a 1 micron thick 3D SIM acquisition in less than a second.  This requires a system design that can deliver 135 images per second, each with a different phase offset, pattern angle, or z-position.   Starting with a brute force approach, a functional system was prototyped and demonstrated.  However challenges with the performance of a critical component and environmental stability issues forced a second round of innovation to create a design robust enough for the commercial market.  Skunk works methods were deployed to bring the new design to market.  In the following years, a second round of optimization was completed resulting in the OMX-SR, which includes even faster acquisition modalities like 2D-SIM and TIRF-SIM.


Bio:  Steve Reese is a Principal Systems Engineer within the Genomics and Cellular Research division of GE Life Sciences.  He has been involved with guiding the development of more than 20 automated fluorescent imaging systems during his 25 years with Applied Precision / GE.  He received a degree in Electrical Engineering from Yale University in 1991.  Most of his career has been focused on optimizing system design and leading teams from problem definition through invention, design, and product execution.  In recent years he has been helping to optimize the integration of the Cellular Analysis team into the larger GE Life Sciences business.



"Combining Ionic Liquids with Scanning Electron Microscopy for In Situ Imaging of Nanoscale Dynamics in Solvated Systems"

David Hoagland, PhD, UMass, Amherst, Department of Polymer Science and Engineering



Image 1 - One frame of a 60-s SEM movie tracking the dynamic nanostructure of a mixed dispersion of 120-nm SiO2spheres (green) and 390x100-nm SiO2 rods (red) within a thin (~30-nm thick) IL film.  Spheres and rods are artificially colored.




Image 2 - One frame of a 20-min, 1000+-frame SEM movie tracking 240-nm Au-coated SiO2 spheres (bright) dispersed on an IL surface among densely packed (i.e., crystalline) 190-nm SiO2 spheres.


Abstract:  Exposure to vacuum generally precludes examination of liquid specimens by electron microscopy, and consequently, liquid and solvated specimens are typically pre-solidified, eliminating opportunities to visualize their dynamics. Even basic structure of many solvated ‘soft matter’ systems has never been visualized by microscopy at a resolution below the diffraction limit of light (~250 nm).  Exploiting nonvolatile ionic liquids as solvating media, we are developing electron microscopy methods that can monitor at the nanoscale the dynamics of soft matter in a manner analogous to that achieved at larger length scales by optical microscopy.  Focus here is directed at in situ scanning electron microscopy (SEM) of nanoparticles trapped in thin liquid films or on liquid interfaces, particularly nanospheres and nanorods of various chemistries and from dilute to high density.  SEM image sequences (‘movies’) visually manifest both expected and unexpected structural and dynamical effects.  Conditions amenable to imaging will be outlined alongside a few pitfalls.



Bio: Professor David Hoagland was trained as a chemical engineer, obtaining a B.S. degree from Stanford and a Ph.D. degree from Princeton before joining the Polymer Science and Engineering Department at the University of Massachusetts Amherst as an assistant professor in 1985.  He has remained in this UMass position since, most recently serving as department head.  Hoagland’s research focuses on charged polymers, single polymer and single nanoparticle dynamics, interfacial assembly, and polymers in ionic liquids.  He is a fellow of the American Physical Society and was a Sigma Xi Distinguished National Lecturer.



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